검색결과 : 13건
| No. | Article |
|---|---|
| 1 |
Effect of light-soaking on the hydrogen effusion mechanisms in polymorphous silicon thin film structures Hamui L, Monroy BM, Cabarrocas RRI, Santana G Materials Chemistry and Physics, 163, 311, 2015 |
| 2 |
Growth, chromium distribution and electrical properties of GaSe:Cr single crystals Atuchin VV, Bereznaya SA, Beisel NF, Korotchenko ZV, Kruchinin VN, Pokrovsky LD, Saprykin AI, Sarkisov SY Materials Chemistry and Physics, 146(1-2), 12, 2014 |
| 3 |
Optical properties of ceria-zirconia epitaxial films grown from chemical solutions Pena-Rodriguez O, Sanchez-Valdes CF, Garriga M, Alonso MI, Obradors X, Puig T Materials Chemistry and Physics, 138(2-3), 462, 2013 |
| 4 |
Spectroscopic ellipsometry study of Cu2ZnGeSe4 and Cu2ZnSiSe4 poly-crystals Leon M, Levcenko S, Serna R, Nateprov A, Gurieva G, Merino JM, Schorr S, Arushanov E Materials Chemistry and Physics, 141(1), 58, 2013 |
| 5 |
Comparative study of tetragonal Cu2In7Se11.5 and trigonal CuIn5Se8 by spectroscopic ellipsometry Levcenko S, Leon M, Gurieva G, Serna R, Merino JM, Friedrich EJ, Arushanov E, Bodnar IV Materials Chemistry and Physics, 125(1-2), 77, 2011 |
| 6 |
Significance of Al on the morphological and optical properties of Ti1-xAlxN thin films Jose F, Ramaseshan R, Dash S, Sundari ST, Jain D, Ganesan V, Chandramohan P, Srinivasan MP, Tyagi AK, Raja B Materials Chemistry and Physics, 130(3), 1033, 2011 |
| 7 |
Optical properties of CuIn5Se8 and CuGa5Se8 from ellipsometric measurements Duran L, Castro J, Naranjo J, Fermin JR, Rincon CAD Materials Chemistry and Physics, 114(1), 73, 2009 |
| 8 |
Biplate artifacts in rotating-compensator ellipsometers Ebert K, Aspnes DE Thin Solid Films, 455-56, 779, 2004 |
| 9 |
Simultaneous determination of reflectance spectra along with {psi(E), Delta(E)} in multichannel ellipsometry : applications to instrument calibration and reduction of real-time data An I, Lee JC, Hong BY, Collins RW Thin Solid Films, 313-314, 79, 1998 |
| 10 |
Depolarization mixed polarization corrections of ellipsometry spectra Rossow U Thin Solid Films, 313-314, 97, 1998 |