| 1 |
Luminescence and electron degradation properties of Bi doped CaO phosphor
Yousif A, Kroon RE, Coetsee E, Ntwaeaborwa OM, Ahmed HAAS, Swart HC
Applied Surface Science, 356, 1064, 2015 |
| 2 |
Hydrated electron-based degradation of atenolol in aqueous solution
Liu XW, Zhang TQ, Wang LL, Shao Y, Fang L
Chemical Engineering Journal, 260, 740, 2015 |
| 3 |
Surface state of Y-3(Al,Ga)(5)O-12:Tb phosphor under electron beam bombardment
Yousif A, Swart HC, Ntwaeaborwa OM
Applied Surface Science, 258(17), 6495, 2012 |
| 4 |
Low voltage electron induced cathodoluminescence degradation and surface characterization of Sr-3(PO4)(2):Tb phosphor
Nagpure IM, Pitale SS, Coetsee E, Ntwaeaborwa OM, Terblans JJ, Swart HC
Applied Surface Science, 257(23), 10147, 2011 |
| 5 |
XPS analysis for degraded Y2SiO5:Ce phosphor thin films
Coetsee E, Terblans JJ, Swart HC
Applied Surface Science, 256(22), 6641, 2010 |
| 6 |
Auger electron/X-ray photoelectron and cathodoluminescent spectroscopic studies of pulsed laser ablated SrAl2O4:Eu2+,Dy3+ thin films
Nsimama PD, Ntwaeaborwa OM, Swart HC
Applied Surface Science, 257(2), 512, 2010 |
| 7 |
중수소 프라즈마 처리가 다결정 실리콘 TFT의 안정성에 미치는 영향에 관한 연구
손송호, 배성찬, 김동환
Korean Journal of Materials Research, 14(7), 516, 2004 |
| 8 |
Electroluminescence and other diagnostic techniques for the study of hot-electron effects in compound semiconductor devices
Zanoni E, Meneghesso G, Menozzi R
Journal of Crystal Growth, 210(1-3), 331, 2000 |
| 9 |
Secondary ion mass spectroscopy characterization of the deuterium sintering process for enhanced-lifetime complementary metal-oxide-semiconductor transistors
Lee J, Aur S, Eklund R, Hess K, Lyding JW
Journal of Vacuum Science & Technology A, 16(3), 1762, 1998 |
| 10 |
Hydrogen in silicon : Fundamental properties and consequences for devices
Van de Walle CG
Journal of Vacuum Science & Technology A, 16(3), 1767, 1998 |
