검색결과 : 1건
No. | Article |
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1 |
Analysis of degradation mechanisms in AlInN/GaN HEMTs by electroluminescence technique Berthet F, Petitdidier S, Guhel Y, Trolet JL, Mary P, Vivier A, Gaquiere C, Boudart B Solid-State Electronics, 127, 13, 2017 |
No. | Article |
---|---|
1 |
Analysis of degradation mechanisms in AlInN/GaN HEMTs by electroluminescence technique Berthet F, Petitdidier S, Guhel Y, Trolet JL, Mary P, Vivier A, Gaquiere C, Boudart B Solid-State Electronics, 127, 13, 2017 |