| 1 |
Study of a Prediction Method of the Failure Time and Failure Voltage of Generator Stator Bars Under the Electrical Stress Test
Sun YX, Chen QG, Cheng S
IEEE Transactions on Energy Conversion, 35(3), 1309, 2020 |
| 2 |
Effects of thermal and electrical stress on defect generation in InAs metal-oxide-semiconductor capacitor
Baik M, Kang HK, Kang YS, Jeong KS, Lee C, Kim H, Song JD, Cho MH
Applied Surface Science, 467, 1161, 2019 |
| 3 |
Analysis of degradation mechanisms in AlInN/GaN HEMTs by electroluminescence technique
Berthet F, Petitdidier S, Guhel Y, Trolet JL, Mary P, Vivier A, Gaquiere C, Boudart B
Solid-State Electronics, 127, 13, 2017 |
| 4 |
Nanoscale Transformations in Metastable, Amorphous, Silicon-Rich Silica
Mehonic A, Buckwell M, Montesi L, Munde MS, Gao D, Hudziak S, Chater RJ, Fearn S, McPhail D, Bosman M, Shluger AL, Kenyon AJ
Advanced Materials, 28(34), 7486, 2016 |
| 5 |
Impact of bias conditions on electrical stress and ionizing radiation effects in Si-based TFETs
Ding LL, Gnani E, Gerardin S, Bagatin M, Driussi F, Selmi L, Le Royer C, Paccagnella A
Solid-State Electronics, 115, 146, 2016 |
| 6 |
Study on the Al-P3HT:PCBM interfaces in electrical stressed polymer solar cell by X-ray photoelectron spectroscopy
Pei Z, Devi BP, Thiyagu S
Solar Energy Materials and Solar Cells, 123, 1, 2014 |
| 7 |
Impact of electrical stress on the electrical characteristics of 2 MeV electron irradiated metal-oxide-silicon capacitors with atomic layer deposited Al2O3, HfO2 and nanolaminated dielectrics
Rafi JM, Gonzalez MB, Takakura K, Tsunoda I, Yoneoka M, Beldarrain O, Zabala M, Campabadal F
Solid-State Electronics, 89, 198, 2013 |
| 8 |
Effect of electrical and mechanical stresses of low temperature a-Si: H thin film transistors fabricated on polyimide and glass substrates
Huang JJ, Chen CN
Thin Solid Films, 529, 454, 2013 |
| 9 |
Characterization and analysis of electrical trap related effects on the reliability of AlGaN/GaN HEMTs
Berthet F, Guhel Y, Gualous H, Boudart B, Trolet JL, Piccione M, Sbrugnera V, Grimbert B, Gaquiere C
Solid-State Electronics, 72, 15, 2012 |
| 10 |
Performance of organic field effect transistors with high-k gate oxide after application of consecutive bias stress
Lee S, Choi C, Lee K, Cho JH, Ko KY, Ahn J
Thin Solid Films, 521, 30, 2012 |
