검색결과 : 2건
No. | Article |
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1 |
Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies Brauer G, Anwand W, Eichhorn F, Skorupa W, Hofer C, Teichert C, Kuriplach J, Cizek J, Prochazka I, Coleman PG, Nozawa T, Kohyama A Applied Surface Science, 252(9), 3342, 2006 |
2 |
On the development of texture during growth of magnetron-sputtered CrN Schell N, Petersen JH, Bottiger J, Mucklich A, Chevallier J, Andreasen KP, Eichhorn F Thin Solid Films, 426(1-2), 100, 2003 |