화학공학소재연구정보센터
검색결과 : 8건
No. Article
1 Plasticization of a Polymer Layer Harnessed to a Silicon Microcantilever as a Highly Sensitive and Selective Means to Detect Nitroaromatic Derivatives
Shemesh A, Blank T, Meltzman S, Stolyarova S, Edrei R, Borzin E, Nemirovsky Y, Eichen Y
Journal of Polymer Science Part A: Polymer Chemistry, 52(15), 2124, 2014
2 Hydrogen and thermal deoxidations of InSb and GaSb substrates for molecular beam epitaxial growth
Weiss E, Klin O, Grossman S, Greenberg S, Klipstein PC, Akhvlediani R, Tessler R, Edrei R, Hoffman A
Journal of Vacuum Science & Technology A, 25(4), 736, 2007
3 Chemical bonding and interdiffusion in scaled down SiO2/Si3N4/SiO2 stacks with top oxide formed by thermal ed copyoxidation
Saraf M, Edrei R, Akhvlediani R, Roizin Y, Shima-Edelstein R, Hoffman A
Journal of Vacuum Science & Technology B, 24(4), 1716, 2006
4 Nitrogen diffusion and accumulation at the Si/SiO2 interface in SiO2/Si3N4/SiO2 structures for nonvolatile semiconductor memories
Saraf M, Edrei R, Shima-Edelstein R, Roizin Y, Hoffman A
Journal of Vacuum Science & Technology B, 23(4), 1558, 2005
5 Evolution of surface topography of as-grown Si films near amorphous-to-polycrystalline transition
Edrei R, Shima R, Gridin VV, Roizin Y, Kaplan WD, Hoffman A
Journal of the Electrochemical Society, 151(12), G904, 2004
6 The effect of deposition process parameters and post-deposition treatments on the poly- and amorphous-silicon morphology
Edrei R, Shauly EN, Roizin Y, Hoffman A
Applied Surface Science, 188(3-4), 539, 2002
7 Influence of implantation and annealing on the surface topography of amorphous and polysilicon thin films
Edrei R, Shauly EN, Hoffman A
Journal of Vacuum Science & Technology A, 20(2), 344, 2002
8 Atomic force microscope study of amorphous silicon and polysilicon low-pressure chemical-vapor-deposited implanted layers
Edrei R, Shauly EN, Hoffman A
Journal of Vacuum Science & Technology B, 18(1), 41, 2000