화학공학소재연구정보센터
검색결과 : 6건
No. Article
1 Unzipping and movement of Lomer-type edge dislocations in Ge/GeSi/Si(001) heterostructures
Bolkhovityanov YB, Deryabin AS, Gutakovskii AK, Sokolov LV
Journal of Crystal Growth, 483, 265, 2018
2 Unexpected travel of Lomer-type dislocations in Ge/GexSi1-x/Si(001) heterostructures
Bolkhovityanov YB, Deryabin AS, Gutakovskii AK, Sokolov LV
Thin Solid Films, 616, 348, 2016
3 An in situ AFM investigation on the morphology of the (100) growth interface of ZTS crystal
Cao YC, Li MW, Cheng M, Song J, Hu ZT
Journal of Crystal Growth, 388, 22, 2014
4 Correlation between etch pits formed by molten KOH+Na2O2 etching and dislocation types in heavily doped n(+)-4H-SiC studied by X-ray topography
Yao YZ, Ishikawa Y, Sugawara Y, Sato K, Danno K, Suzuki H, Bessho T, Yamaguchi S, Nishikawa K
Journal of Crystal Growth, 364, 7, 2013
5 Nucleation of 3C-SiC associated with threading edge dislocations during chemical vapor deposition
Abadier M, Berechman RA, Neudeck PG, Trunek AJ, Skowronski M
Journal of Crystal Growth, 347(1), 45, 2012
6 Control of misfit dislocations in strain-relaxed SiGe buffer layers on SOI substrates
Taoka N, Sakai A, Mochizuki S, Nakatsuka O, Ogawa M, Zaima S
Thin Solid Films, 508(1-2), 147, 2006