검색결과 : 6건
No. | Article |
---|---|
1 |
Unzipping and movement of Lomer-type edge dislocations in Ge/GeSi/Si(001) heterostructures Bolkhovityanov YB, Deryabin AS, Gutakovskii AK, Sokolov LV Journal of Crystal Growth, 483, 265, 2018 |
2 |
Unexpected travel of Lomer-type dislocations in Ge/GexSi1-x/Si(001) heterostructures Bolkhovityanov YB, Deryabin AS, Gutakovskii AK, Sokolov LV Thin Solid Films, 616, 348, 2016 |
3 |
An in situ AFM investigation on the morphology of the (100) growth interface of ZTS crystal Cao YC, Li MW, Cheng M, Song J, Hu ZT Journal of Crystal Growth, 388, 22, 2014 |
4 |
Correlation between etch pits formed by molten KOH+Na2O2 etching and dislocation types in heavily doped n(+)-4H-SiC studied by X-ray topography Yao YZ, Ishikawa Y, Sugawara Y, Sato K, Danno K, Suzuki H, Bessho T, Yamaguchi S, Nishikawa K Journal of Crystal Growth, 364, 7, 2013 |
5 |
Nucleation of 3C-SiC associated with threading edge dislocations during chemical vapor deposition Abadier M, Berechman RA, Neudeck PG, Trunek AJ, Skowronski M Journal of Crystal Growth, 347(1), 45, 2012 |
6 |
Control of misfit dislocations in strain-relaxed SiGe buffer layers on SOI substrates Taoka N, Sakai A, Mochizuki S, Nakatsuka O, Ogawa M, Zaima S Thin Solid Films, 508(1-2), 147, 2006 |