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| No. | Article |
|---|---|
| 1 |
Influence of crystallographic orientation on local strains in silicon: A combined high-resolution X-ray diffraction and finite element modelling investigation Eberlein M, Escoubas S, Gailhanou M, Thomas O, Rohr P, Coppard R Thin Solid Films, 516(22), 8042, 2008 |