검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
White light interferometry for quantitative surface characterization in ion sputtering experiments Baryshev SV, Zinovev AV, Tripa CE, Erck RA, Veryovkin IV Applied Surface Science, 258(18), 6963, 2012 |
| 2 |
ADHESION OF SILVER FILMS TO ION-BOMBARDED SILICON-CARBIDE -ION-DOSE DEPENDENCE AND WEIBULL STATISTICAL-ANALYSIS OF PULL-TEST RESULTS ERCK RA, LAUER BA, NICHOLS FA Journal of Adhesion Science and Technology, 8(8), 885, 1994 |
| 3 |
Pull-Test Measurements of Diamond-Like Carbon-Films on Silicon-Carbide, Silicon-Nitride, Aluminum-Oxide, and Zirconium-Oxide Erck RA, Nichols FA, Dierks JF Journal of Vacuum Science & Technology A, 12(4), 1583, 1994 |
| 4 |
Observation of Cryopump Fluorescence During Operation of Electron-Beam Evaporator Erck RA Journal of Vacuum Science & Technology A, 12(5), 2931, 1994 |
| 5 |
Pin-Pull Adhesion Measurements of Copper-Films on Ion-Bombarded Alumina Erck RA Thin Solid Films, 253(1-2), 362, 1994 |