1 |
Do Particles Interact Electronically? -Proof of Interparticle Charge-transfer Excitation between Adjoined Anatase and Rutile Particles Shen Y, Nitta A, Takashima M, Ohtani B Chemistry Letters, 50(1), 80, 2021 |
2 |
Influence of TiO2 structure on its photocatalytic activity towards acetaldehyde decomposition Tryba B, Jafari S, Sillanpaa M, Nitta A, Ohtani B, Morawski AW Applied Surface Science, 470, 376, 2019 |
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Identification and characterization of titania photocatalyst powders using their energy-resolved distribution of electron traps as a fingerprint Nitta A, Takashima M, Takase M, Ohtani B Catalysis Today, 321, 2, 2019 |
4 |
Reversed double-beam photoacoustic spectroscopy of metal-oxide powders for estimation of their energy-resolved distribution of electron traps and electronic-band structure Nitta A, Takashima M, Murakami N, Takase M, Ohtani B Electrochimica Acta, 264, 83, 2018 |
5 |
W and Mo doped TiO2: Synthesis, characterization and photocatalytic activity Aviles-Garcia O, Espino-Valencia J, Romero R, Rico-Cerda JL, Arroyo-Albiter M, Natividad R Fuel, 198, 31, 2017 |
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Analysis of degradation mechanisms in AlInN/GaN HEMTs by electroluminescence technique Berthet F, Petitdidier S, Guhel Y, Trolet JL, Mary P, Vivier A, Gaquiere C, Boudart B Solid-State Electronics, 127, 13, 2017 |
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Ultrawide band gap amorphous oxide semiconductor, Ga-Zn-O Kim J, Miyokawa N, Sekiya T, Ide K, Toda Y, Hiramatsu H, Hosono H, Kamiya T Thin Solid Films, 614, 84, 2016 |
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Semiconducting properties of ZnO/TiO2 composites by electrochemical measurements and their relationship with photocatalytic activity Ramirez-Ortega D, Melendez AM, Acevedo-Pena P, Gonzalez I, Arroyo R Electrochimica Acta, 140, 541, 2014 |
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Characterization of deep electron traps in 4H-SiC Junction Barrier Schottky rectifiers Gelczuk L, Dabrowska-Szata M, Sochacki M, Szmidt J Solid-State Electronics, 94, 56, 2014 |
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High Mobility N-Type Transistors Based on Solution-Sheared Doped 6,13-Bis(triisopropylsilylethynyl)pentacene Thin Films Naab BD, Himmelberger S, Diao Y, Vandewal K, Wei P, Lussem B, Salleo A, Bao ZN Advanced Materials, 25(33), 4663, 2013 |