검색결과 : 1건
No. | Article |
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1 |
Identities of the deep level defects E(1)/E(2) in 6H silicon carbide Ling CC, Chen XD, Gong M, Weng HM, Hang DS, Beling CD, Fung S, Lam TW, Lam CH Materials Science Forum, 445-6, 135, 2004 |
No. | Article |
---|---|
1 |
Identities of the deep level defects E(1)/E(2) in 6H silicon carbide Ling CC, Chen XD, Gong M, Weng HM, Hang DS, Beling CD, Fung S, Lam TW, Lam CH Materials Science Forum, 445-6, 135, 2004 |