화학공학소재연구정보센터
검색결과 : 5건
No. Article
1 Dynamic optical filtering in DWDM systems using the DMD
Duncan WM, Bartlett T, Lee B, Powell D, Rancuret P, Sawyers B
Solid-State Electronics, 46(10), 1583, 2002
2 Real-time composition control using spectral ellipsometry in growth of Hg1-xCdxTe by molecular beam epitaxy
Aqariden F, Shih HD, Liao PK, Duncan WM, Dat R
Journal of Vacuum Science & Technology B, 18(3), 1381, 2000
3 Real-Time Diagnostics of II-VI Molecular-Beam Epitaxy by Spectral Ellipsometry
Duncan WM, Bevan MJ, Shih HD
Journal of Vacuum Science & Technology A, 15(2), 216, 1997
4 Near-Field Scanning Optical Microscope for Microelectronic Materials and Devices
Duncan WM
Journal of Vacuum Science & Technology A, 14(3), 1914, 1996
5 High-Speed Spectral Ellipsometry for in-Situ Diagnostics and Process-Control
Duncan WM, Henck SA, Kuehne JW, Loewenstein LM, Maung S
Journal of Vacuum Science & Technology B, 12(4), 2779, 1994