1 |
Resonance reflection of light by ordered silicon nanopillar arrays with the vertical p-n junction Basalaeva LS, Nastaushev YV, Kryzhanovskaya NV, Moiseev EI, Radnatarov DA, Khripunov SA, Utkin DE, Chistokhin IB, Latyshev AV, Dultsev FN Thin Solid Films, 672, 109, 2019 |
2 |
Transformation of porous structure under vacuum ultraviolet irradiation of the films based on silicon dioxide Dultsev FN, Nekrasov DV Thin Solid Films, 603, 249, 2016 |
3 |
QCM-Based Measurement of Bond Rupture Forces in DNA Double Helices for Complementarity Sensing Dultsev FN, Kolosovsky EA, Mik IA, Lomzov AA, Pyshnyi DV Langmuir, 30(13), 3795, 2014 |
4 |
New Procedure to Record the Rupture of Bonds between Macromolecules and the Surface of the Quartz Crystal Microbalance (QCM) Dultsev FN, Kolosovsky EA, Mik IA Langmuir, 28(39), 13793, 2012 |
5 |
Ellipsometric investigation of the mechanism of the formation of titanium oxynitride nanolayers Dultsev FN, Svitasheva SN, Nastaushev YV, Aseev AL Thin Solid Films, 519(19), 6344, 2011 |
6 |
Etching and oxidation of InAs in planar inductively coupled plasma Dultsev FN, Kesler VG Applied Surface Science, 256(1), 246, 2009 |
7 |
QCM Operating in Threshold Mode as a Gas Sensor Dultsev FN, Kolosovsky EA Langmuir, 25(20), 12195, 2009 |
8 |
Features of photopolymerization of Langmiur-Blodgett thin films of acetylenic acids Dultsev FN, Badmaeva IA Thin Solid Films, 518(1), 328, 2009 |
9 |
Water as a clustering agent in photolysis and photonucleation of benzaldehyde vapor Dultseva GG, Dubtsov SN, Dultsev FN Journal of Physical Chemistry A, 112(23), 5264, 2008 |
10 |
The role of Laplace pressure in the formation of the structure of thin layers based on silicon dioxide Dultsev FN, Mikhailovskii IP Applied Surface Science, 253(6), 3181, 2007 |