검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Measurement of effective carrier lifetime at the semiconductor-dielectric interface by Photoconductive Decay (PCD) Method Drummond PJ, Bhatia D, Ruzyllo J Solid-State Electronics, 81, 130, 2013 |
| 2 |
Studies of photoconductance decay method for characterization of near-surface electrical properties of semiconductors Drummond PJ, Bhatia D, Kshirsagar A, Ramani S, Ruzyllo J Thin Solid Films, 519(22), 7621, 2011 |