검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Characterization of wafer-scale MoS2 and WSe2 2D films by spectroscopic ellipsometry Diware MS, Park K, Mun J, Park HG, Chegal W, Cho YJ, Cho HM, Park J, Kim H, Kang SW, Kim YD Current Applied Physics, 17(10), 1329, 2017 |
| 2 |
Optical properties and photo-oxidative degradation of regioregular poly(3-butylthiophene) films by spectroscopic ellipsometry Diware MS, Kim TJ, Byun JS, Hwang SY, Barange NS, Kim YD Thin Solid Films, 542, 338, 2013 |
| 3 |
Dielectric functions of In-1 (-) xAlxSb alloys for arbitrary compositions with parametric modeling Diware MS, Kim TJ, Yoon JJ, Barange NS, Byun JS, Park HG, Kim YD, Shin SH, Song JD Thin Solid Films, 546, 26, 2013 |
| 4 |
Analytic representation of the dielectric functions of InAsxSb1-x alloys in the parametric model Hwang SY, Kim TJ, Byun JS, Barange NS, Diware MS, Kim YD, Aspnes DE, Yoon JJ, Song JD Thin Solid Films, 547, 276, 2013 |