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| No. | Article |
|---|---|
| 1 |
Resistive switching-like behavior of the dielectric breakdown in ultra-thin Hf based gate stacks in MOSFETs Crespo-Yepes A, Martin-Martinez J, Rothschild A, Rodriguez R, Nafria M, Aymerich X Solid-State Electronics, 65-66, 157, 2011 |