검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Deuterium depth profile quantification in a ASDEX Upgrade divertor tile using secondary ion mass spectrometry Ghezzi F, Caniello R, Giubertoni D, Bersani M, Hakola A, Mayer M, Rohde V, Anderle M Applied Surface Science, 315, 459, 2014 |