| 1 |
Unzipping and movement of Lomer-type edge dislocations in Ge/GeSi/Si(001) heterostructures
Bolkhovityanov YB, Deryabin AS, Gutakovskii AK, Sokolov LV
Journal of Crystal Growth, 483, 265, 2018 |
| 2 |
Unexpected travel of Lomer-type dislocations in Ge/GexSi1-x/Si(001) heterostructures
Bolkhovityanov YB, Deryabin AS, Gutakovskii AK, Sokolov LV
Thin Solid Films, 616, 348, 2016 |
| 3 |
Edge misfit dislocations in the GeSi/Si(001) pair: Conditions and specific features of high-quantity generation
Bolkhovityanov YB, Deryabin AS, Gutakovskii AK, Sokolov LV
Journal of Crystal Growth, 338(1), 12, 2012 |
| 4 |
Specific features of formation and propagation of 60 degrees and 90 degrees misfit dislocations in GexS1-x/Si films with x > 0.4
Bolkhovityanov YB, Deryabin AS, Gutakovskii AK, Sokolov LV
Journal of Crystal Growth, 312(21), 3080, 2010 |
| 5 |
Formation of edge misfit dislocations in Ge chi Si1-chi (chi similar to 0.4-0.5) films grown on misoriented (001) -> (111) Si substrates
Bolkhovityanov YB, Deryabin AS, Gutakovskii AK, Sokolov LV
Journal of Crystal Growth, 310(15), 3422, 2008 |
| 6 |
Dominating nucleation of misfit dislocations from the surface in GeSi/Si(001) films with a stepwise composition grown by means of molecular-beam epitaxy
Bolkhovityanov YB, Deryabin AS, Gutakovskii AK, Revenko MA, Sokolov L
Journal of Crystal Growth, 293(2), 247, 2006 |
| 7 |
Sb as surfactant at plastic relaxation of GeSi/Si(001) films grown by molecular-beam epitaxy: Reduction of surface roughness value
Bolkhovityanov YB, Deryabin AS, Gutakovskii AK, Sokolov L
Journal of Crystal Growth, 297(1), 57, 2006 |
| 8 |
Structures GexSi1-x/Si(001) grown by low-temperature (300-400 degrees C) molecular beam epitaxy: Misfit dislocation propagation
Bolkhovityanov YB, Deryabin AS, Gutakovskii AK, Revenko MA, Sokolov LV
Journal of Crystal Growth, 280(1-2), 309, 2005 |
| 9 |
Heterostructures GexSi1-x/Si(001) (x=0.18-0.62) grown by molecular beam epitaxy at a low (350 degrees C) temperature: specific features of plastic relaxation
Bolkhovityanov YB, Deryabin AS, Gutakovskii AK, Revenko MA, Sokolov LV
Thin Solid Films, 466(1-2), 69, 2004 |
