검색결과 : 12건
| No. | Article |
|---|---|
| 1 |
Ion beam sputtered aluminum based multilayer mirrors for extreme ultraviolet solar imaging Ziani A, Delmotte F, Le Paven-Thivet C, Meltchakov E, Jerome A, Roulliay M, Bridou F, Gasc K Thin Solid Films, 552, 62, 2014 |
| 2 |
Characterization of subnanometric layers by grazing incidence X-ray reflectometry Emprin B, Troussel P, Soullie G, Stemmler P, Mercere P, Meltchakov E, Jerome A, Delmotte F Thin Solid Films, 556, 54, 2014 |
| 3 |
Experimental study of Cr/Sc multilayer mirrors for the nitrogen K-alpha-emission line Hardouin A, Delmotte F, Ravet MF, Bridou F, Jerome A, Varniere F, Montcalm C, Hedacq S, Gullikson E, Aubert P Journal of Vacuum Science & Technology A, 26(3), 333, 2008 |
| 4 |
Thin multilayers characterization by grazing X-ray reflectometry and use of Fourier transform Bridou F, Gautier J, Delmotte F, Ravet MF, Durand O, Modreanu M Applied Surface Science, 253(1), 12, 2006 |
| 5 |
Non-destructive X-ray study of the interphases in Mo/Si and Mo/B4C/Si/B4C multilayers Maury H, Jonnard P, Andre JM, Gautier J, Roulliay M, Bridou F, Delmotte F, Ravet MF, Jerome A, Holliger P Thin Solid Films, 514(1-2), 278, 2006 |
| 6 |
Interpretation of stress variation in silicon nitride films deposited by electron cyclotron resonance plasma Besland MP, Lapeyrade M, Delmotte F, Hollinger G Journal of Vacuum Science & Technology A, 22(5), 1962, 2004 |
| 7 |
High density plasma deposition of device quality silicon nitride. II. Effects of thickness on the electrical properties Hugon MC, Delmotte F, Agius B, Irene EA Journal of Vacuum Science & Technology B, 17(4), 1430, 1999 |
| 8 |
Stability analysis of a multiple-model controller for constrained uncertain nonlinear systems Dubois L, Delmotte F, Borne P, Fukuda T International Journal of Control, 69(4), 519, 1998 |
| 9 |
Electrical-Properties of Metal-Insulator-Semiconductor Structures with Silicon-Nitride Dielectrics Deposited by Low-Temperature Plasma-Enhanced Chemical-Vapor-Deposition Distributed Electron-Cyclotron-Resonance Hugon MC, Delmotte F, Agius B, Courant JL Journal of Vacuum Science & Technology A, 15(6), 3143, 1997 |
| 10 |
Low temperature deposition of SiNx : H using SiH4-N-2 or SiH4-NH3 distributed electron cyclotron resonance microwave plasma Delmotte F, Hugon MC, Agius B, Courant JL Journal of Vacuum Science & Technology B, 15(6), 1919, 1997 |