검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Mechanisms of copper direct bonding observed by in-situ and quantitative transmission electron microscopy Martinez M, Legros M, Signamarcheix T, Bally L, Verrun S, Di Cioccio L, Deguet C Thin Solid Films, 530, 96, 2013 |
| 2 |
105 nm Gate length pMOSFETs with high-K and metal gate fabricated in a Si process line on 200 mm GeOI wafers Le Royer C, Clavelier L, Tabone C, Romanjek K, Deguet C, Sanchez L, Hartmann JM, Roure MC, Grampeix H, Soliveres S, Le Carval G, Truche R, Pouydebasque A, Vinet M, Deleonibus S Solid-State Electronics, 52(9), 1285, 2008 |