검색결과 : 17건
No. | Article |
---|---|
1 |
Broadening of vibrational levels in X-ray absorption spectroscopy of molecular nitrogen in compound semiconductors Petravic M, Gao Q, Llewellyn D, Deenapanray PNK, Macdonald D, Crotti C Chemical Physics Letters, 425(4-6), 262, 2006 |
2 |
Direct observation of defect levels in InN by soft x-ray absorption spectroscopy Petravic M, Deenapanray PNK, Fraser MD, Soldatov AV, Yang YW, Anderson PA, Durbin SM Journal of Physical Chemistry B, 110(7), 2984, 2006 |
3 |
Hydrogen reintroduction by forming gas annealing to LPCVD silicon nitride coated structures Jin H, Weber KJ, Deenapanray PNK, Blakers AW Journal of the Electrochemical Society, 153(8), G750, 2006 |
4 |
Investigation of reactive ion etching of dielectrics and Si in CHF3/O-2 or CHF3/Ar for photovoltaic applications Gatzert C, Blakers AW, Deenapanray PNK, Macdonald D, Auret FD Journal of Vacuum Science & Technology A, 24(5), 1857, 2006 |
5 |
Modeling of static concentrator modules incorporating lambertian or v-groove rear reflectors Weber KJ, Everett V, Deenapanray PNK, Franklin E, Blakers AW Solar Energy Materials and Solar Cells, 90(12), 1741, 2006 |
6 |
Minority carrier lifetime properties of reactive ion etched p-type float zone Si Deenapanray PNK, Horteis M, Macdonald D, Weber KJ Electrochemical and Solid State Letters, 8(3), G78, 2005 |
7 |
Electrical characterization of impurity-free disordered p-type GaAs Deenapanray PNK, Coleman VA, Jagadish C Electrochemical and Solid State Letters, 6(3), G37, 2003 |
8 |
Defective crystal recovered from the crystallization of potassium-doped amorphous silicon films Liu ACY, McCallum JC, Deenapanray PNK Journal of the Electrochemical Society, 150(4), G266, 2003 |
9 |
Towards a better understanding of the operative mechanisms underlying impurity-free disordering of GaAs: Effect of stress Doshi S, Deenapanray PNK, Tan HH, Jagadish C Journal of Vacuum Science & Technology B, 21(1), 198, 2003 |
10 |
On the pulsed anodic oxidation of n(+)-InP Deenapanray PNK, Martin A, Lever P, Jagadish C Electrochemical and Solid State Letters, 5(6), G41, 2002 |