검색결과 : 11건
| No. | Article |
|---|---|
| 1 |
Status and review of two-dimensional carrier and dopant profiling using scanning probe microscopy De Wolf P, Stephenson R, Trenkler T, Clarysse T, Hantschel T, Vandevorst W Journal of Vacuum Science & Technology B, 18(1), 361, 2000 |
| 2 |
Nonmonotonic behavior of the scanning capacitance microscope for large dynamic range samples Stephenson R, Verhulst A, De Wolf P, Caymax M, Vandervorst W Journal of Vacuum Science & Technology B, 18(1), 405, 2000 |
| 3 |
Evaluating probes for "electrical" atomic force microscopy Trenkler T, Hantschel T, Stephenson R, De Wolf P, Vandervorst W, Hellemans L, Malave A, Buchel D, Oesterschulze E, Kulisch W, Niedermann P, Sulzbach T, Ohlsson O Journal of Vacuum Science & Technology B, 18(1), 418, 2000 |
| 4 |
Comparison of two-dimensional carrier profiles in metal-oxide-semiconductor field-effect transistor structures obtained with scanning spreading resistance microscopy and inverse modeling De Wolf P, Vandervorst W, Smith H, Khalil N Journal of Vacuum Science & Technology B, 18(1), 540, 2000 |
| 5 |
Practicalities and limitations of scanning capacitance microscopy for routine integrated circuit characterization Stephenson R, De Wolf P, Trenkler T, Hantschel T, Clarysse T, Jansen P, Vandervorst W Journal of Vacuum Science & Technology B, 18(1), 555, 2000 |
| 6 |
Two-dimensional carrier profiling of InP-based structures using scanning spreading resistance microscopy. De Wolf P, Geva M, Reynolds CL, Hantschel T, Vandervorst W, Bylsma RB Journal of Vacuum Science & Technology A, 17(4), 1285, 1999 |
| 7 |
Quantification of nanospreading resistance profiling data De Wolf P, Clarysse T, Vandervorst W Journal of Vacuum Science & Technology B, 16(1), 320, 1998 |
| 8 |
Cross-sectional nano-spreading resistance profiling De Wolf P, Clarysse T, Vandervorst W, Hellemans L, Niedermann P, Hanni W Journal of Vacuum Science & Technology B, 16(1), 355, 1998 |
| 9 |
Nanopotentiometry : Local potential measurements in complementary metal-oxide-semiconductor transistors using atomic force microscopy Trenkler T, De Wolf P, Vandervorst W, Hellemans L Journal of Vacuum Science & Technology B, 16(1), 367, 1998 |
| 10 |
Epitaxial staircase structure for the calibration of electrical characterization techniques Clarysse T, Caymax M, De Wolf P, Trenkler T, Vandervorst W, McMurray JS, Kim J, Williams CC, Clark JG, Neubauer G Journal of Vacuum Science & Technology B, 16(1), 394, 1998 |