| 1 |
Two-dimensional versus three-dimensional post-deposition grain growth in epitaxial oxide thin films Influence of the substrate surface roughness
Bachelet R, Boulle A, Soulestin B, Rossignol F, Guinebretiere R, Dauger A
Thin Solid Films, 515(18), 7080, 2007 |
| 2 |
Recent advances in high-resolution X-ray diffractometry applied to nanostructured oxide thin films: The case of yttria stabilized zirconia epitaxially grown on sapphire
Boulle A, Guinebretiere R, Masson O, Bachelet R, Conchon F, Dauger A
Applied Surface Science, 253(1), 95, 2006 |
| 3 |
X-ray reflectivity, diffraction and grazing incidence small angle X-ray scattering as complementary methods in the microstructural study of sol-gel zirconia thin films
Lenormand P, Lecomte A, Babonneau D, Dauger A
Thin Solid Films, 495(1-2), 224, 2006 |
| 4 |
Strain profiles in yttria stabilized zirconia epitaxial thin films determined by high-resolution X-ray diffraction
Boulle A, Masson O, Guinebretiere R, Dauger A
Thin Solid Films, 450(1), 66, 2004 |
| 5 |
Defect structure of pulsed laser deposited LiNbO3/Al2O3 layers determined by X-ray diffraction reciprocal space mapping
Boulle A, Canale L, Guinebretiere R, Girault-Di Bin C, Dauger A
Thin Solid Films, 429(1-2), 55, 2003 |
| 6 |
X-ray diffraction from epitaxial oxide layers grown from sol-gel
Boulle A, Masson O, Guinebretiere R, Dauger A
Thin Solid Films, 434(1-2), 1, 2003 |
| 7 |
Microstructural analysis in epitaxial zirconia layers
Boulle A, Pradier L, Masson O, Guinebretiere R, Dauger A
Applied Surface Science, 188(1-2), 80, 2002 |
| 8 |
Miscut angles measurement and precise sample positioning with a four circle diffractometer
Boulle A, Masson O, Guinebretiere R, Dauger A
Applied Surface Science, 180(3-4), 322, 2001 |
| 9 |
Stacking disorder in aurivillius compounds studied by X-ray diffraction line profile analysis
Boulle A, Legrand C, Thomas P, Guinebretiere R, Mercurio JP, Dauger A
Materials Science Forum, 378-3, 753, 2001 |
| 10 |
X-Ray diffraction line broadening by stacking faults in SrBi2Nb2O9/SrTiO3 epitaxial thin films
Boulle A, Legrand C, Guinebretiere R, Mercurio JP, Dauger A
Thin Solid Films, 391(1), 42, 2001 |
