검색결과 : 12건
No. | Article |
---|---|
1 |
Stable bismuth sub-monolayer termination of Bi2Se3 Hermanowicz M, Koczorowski W, Bazarnik M, Kopciuszynski M, Zdyb R, Materna A, Hruban A, Czajka R, Radny MW Applied Surface Science, 476, 701, 2019 |
2 |
Electronics of Ba adsorbed on Ge(001) Puchalska A, Jurczyszyn L, Koczorowski W, Czajka R, Radny MW Applied Surface Science, 481, 1474, 2019 |
3 |
Higher order reconstructions of the Ge(001) surface induced by a Ba layer Koczorowski W, Grzela T, Puchalska A, Radny MW, Jurczyszyn L, Schofield SR, Czajka R, Curson NJ Applied Surface Science, 435, 438, 2018 |
4 |
Reversible, long-term passivation of Ge(001) by a Ba-induced incorporated phase Koczorowski W, Grzela T, Puchalska A, Jurczyszyn L, Czajka R, Radny MW Applied Surface Science, 419, 305, 2017 |
5 |
Chemical etching of stainless steel 301 for improving performance of electrochemical capacitors in aqueous electrolyte Jezowski P, Nowicki M, Grzeszkowiak M, Czajka R, Beguin F Journal of Power Sources, 279, 555, 2015 |
6 |
STM/STS characterization of platinum silicide nanostructures grown on a Pt(111) surface Koczorowski W, Bazarnik M, Cegiel M, Petroutchik A, Wawro A, Czajka R Applied Surface Science, 256(13), 4215, 2010 |
7 |
STM study of titanium silicide nanostructure growth on Si(111)-(root 19 x root 19) substrate Cegiel M, Bazarnik M, Biskupski P, Winiarz S, Gutek J, Bos A, Suto S, Mielcarek S, Wawro A, Czajka R Applied Surface Science, 254(21), 6948, 2008 |
8 |
Nanostructure characterization of (SmS)(1.19)TaS2 by means of STM/STS Winiarza S, Klimczuk T, Cava RJ, Czajka R Journal of Crystal Growth, 297(1), 7, 2006 |
9 |
Atomic force microscopy investigation of nanometer-scale modifications of polymer morphology caused by ultraviolet irradiation Nowicki M, Kaczmarek H, Czajka R, Susla B Journal of Vacuum Science & Technology A, 18(5), 2477, 2000 |
10 |
Characterization and nanometer-scale modifications of Bi2Te3 surface via atomic force microscopy Czajka R, Horak J, Lost'ak P, Karamazov S, Vanis J, Walachova J Journal of Vacuum Science & Technology B, 18(3), 1194, 2000 |