검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Curvature radius measurement by optical profiler and determination of the residual stress in thin films Besnard A, Ardigo MR, Imhoff L, Jacquet P Applied Surface Science, 487, 356, 2019 |
| 2 |
MOVPE-grown AlxGa1-xAsyP1-y strain compensating layers on GaAs Maassdorf A, Zeimer U, Weyers M Journal of Crystal Growth, 370, 150, 2013 |
| 3 |
Exploring Pd-Si(001) and Pd-Si(111) thin-film reactions by simultaneous synchrotron X-ray diffraction and substrate curvature measurements Richard MI, Fouet J, Guichet C, Mocuta C, Thomas O Thin Solid Films, 530, 100, 2013 |
| 4 |
Residual stresses and Raman shift relation in anatase TiO2 thin film Alhomoudi IA, Newaz G Thin Solid Films, 517(15), 4372, 2009 |
| 5 |
Bimaterial curvature measurements for the CTE of adhesives: optimization, modeling, and stability Yu JH, Guo S, Dillard DA Journal of Adhesion Science and Technology, 17(2), 149, 2003 |