화학공학소재연구정보센터
검색결과 : 7건
No. Article
1 Contact Area-Dependent Electron Transport in Au/n-type Ge Schottky Junction
Kim H, Lee DH, Myung HS
Korean Journal of Materials Research, 26(8), 412, 2016
2 Compact modeling solutions for short-channel SOI Schottky barrier MOSFETs
Schwarz M, Holtij T, Kloes A, Iniguez B
Solid-State Electronics, 82, 86, 2013
3 Macromolecule-semiconductor interfaces: From enzyme immobilization to photoelectrocatalytical applications
Skorupska K, Lewerenz HJ, Smith JR, Kulesza PJ, Mernagh D, Campbell SA
Journal of Electroanalytical Chemistry, 662(1), 169, 2011
4 Experimental characterization of the subthreshold leakage current in triple-gate FinFETs
Tsormpatzoglou A, Dimitriadis CA, Mouis M, Ghibaudo G, Collaert N
Solid-State Electronics, 53(3), 359, 2009
5 Mechanism of current leakage through metal/n-GaN interfaces
Oyama S, Hashizume T, Hasegawa H
Applied Surface Science, 190(1-4), 322, 2002
6 Development of scanning displacement current microscope
Okuda A, Majima Y, Iwamoto M
Molecular Crystals and Liquid Crystals Science and Technology. Section A. Molecular Crystals and Liquid Crystals, 370, 297, 2001
7 The waveform separation of displacement current and tunneling current using a scanning vibrating probe
Majima Y, Uehara S, Masuda T, Okuda A, Iwamoto M
Thin Solid Films, 393(1-2), 204, 2001