검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Characterization and modeling of 28-nm FDSOI CMOS technology down to cryogenic temperatures Beckers A, Jazaeri F, Bohuslayskyi H, Hutin L, De Franceschi S, Enz C Solid-State Electronics, 159, 106, 2019 |
| No. | Article |
|---|---|
| 1 |
Characterization and modeling of 28-nm FDSOI CMOS technology down to cryogenic temperatures Beckers A, Jazaeri F, Bohuslayskyi H, Hutin L, De Franceschi S, Enz C Solid-State Electronics, 159, 106, 2019 |