검색결과 : 7건
| No. | Article |
|---|---|
| 1 |
Digital and analog TFET circuits: Design and benchmark Strangio S, Settino F, Palestri P, Lanuzza M, Crupi F, Esseni D, Selmi L Solid-State Electronics, 146, 50, 2018 |
| 2 |
Understanding the impact of point-contact scheme and selective emitter in a c-Si BC-BJ solar cell by full 3D numerical simulations Guerra N, De Rose R, Guevara M, Procel P, Lanuzza M, Crupi F Solar Energy, 155, 1443, 2017 |
| 3 |
Benchmarks of a III-V TFET technology platform against the 10-nm CMOS FinFET technology node considering basic arithmetic circuits Strangio S, Palestri P, Lanuzza M, Esseni D, Crupi F, Selmi L Solid-State Electronics, 128, 37, 2017 |
| 4 |
On recoverable behavior of PBTI in AlGaN/GaN MOS-HEMT Acurio E, Crupi F, Magnone P, Trojman L, Meneghesso G, Iucolano F Solid-State Electronics, 132, 49, 2017 |
| 5 |
Multiple gate NVM cells with improved Fowler-Nordheim tunneling program and erase performances Gerardi C, Tripiciano E, Cina G, Lombardo S, Garozzo C, Corso D, Betro G, Pace C, Crupi F Solid-State Electronics, 54(11), 1319, 2010 |
| 6 |
Impact strain engineering on gate stack quality and reliability Claeys C, Simoen E, Put S, Giusi G, Crupi F Solid-State Electronics, 52(8), 1115, 2008 |
| 7 |
Low frequency current noise in unstressed/stressed thin oxide metal-oxide-semiconductor capacitors Crupi F, Iannaccone G, Ciofi C, Neri B, Lombardo S, Pace C Solid-State Electronics, 46(11), 1807, 2002 |