검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Survey of methods to characterize thin absorbing films with Spectroscopic Ellipsometry Hilfiker JN, Singh N, Tiwald T, Convey D, Smith SM, Baker JH, Tompkins HG Thin Solid Films, 516(22), 7979, 2008 |
| 2 |
Effects of energetic particle bombardment on residual stress, microstrain and grain size of plasma-assisted PVD Cr thin films Hsieh JH, Li C, Wu W, Hochman RF Thin Solid Films, 424(1), 103, 2003 |
| 3 |
Thin film properties by facing targets sputtering system Kim KH, Son IH, Song KB, Kong SH, Keum MJ, Nakagawa S, Naoe M Applied Surface Science, 169, 410, 2001 |
| 4 |
Effects of Deposition Parameters on the Texture of Chromium Films Deposited by Vacuum Are Evaporation Gautier C, Machet J Thin Solid Films, 289(1-2), 34, 1996 |