검색결과 : 10건
| No. | Article |
|---|---|
| 1 |
TiO2 nanotree films for the production of green H-2 by solar water splitting: From microstructural and optical characteristics to the photocatalytic properties Miquelot A, Debieu O, Rouessac V, Villeneuve C, Prud'homme N, Cure J, Constantoudis V, Papavieros G, Roualdes S, Vahlas C Applied Surface Science, 494, 1127, 2019 |
| 2 |
Plasma-Assisted Nanoscale Protein Patterning on Si Substrates via Colloidal Lithography Malainou A, Tsougeni K, Ellinas K, Petrou PS, Constantoudis V, Sarantopoulou E, Awsiuk K, Bernasik A, Budkowski A, Markou A, Panagiotopoulos I, Kakabakos SE, Gogolides E, Tserepi A Journal of Physical Chemistry A, 117(50), 13743, 2013 |
| 3 |
Solution processable tungsten polyoxometalate as highly effective cathode interlayer for improved efficiency and stability polymer solar cells Palilis LC, Vasilopoulou M, Douvas AM, Georgiadou DG, Kennou S, Stathopoulos NA, Constantoudis V, Argitis P Solar Energy Materials and Solar Cells, 114, 205, 2013 |
| 4 |
Plasma Nanotextured PMMA Surfaces for Protein Arrays: Increased Protein Binding and Enhanced Detection Sensitivity Tsougeni K, Tserepi A, Constantoudis V, Gogolides E, Petrou PS, Kakabakos SE Langmuir, 26(17), 13883, 2010 |
| 5 |
Line edge roughness and critical dimension variation: Fractal characterization and comparison using model functions Constantoudis V, Patsis GP, Leunissen LHA, Gogolides E Journal of Vacuum Science & Technology B, 22(4), 1974, 2004 |
| 6 |
Effects on surface morphology of epitaxial Y2O3 layers on Si(001) after postgrowth annealing Ioannou-Sougleridis V, Constantoudis V, Alexe M, Scholz R, Vellianitis G, Dimoulas A Thin Solid Films, 468(1-2), 303, 2004 |
| 7 |
Surface roughness induced by plasma etching of Si-containing polymers Tserepi A, Gogolides E, Constantoudis V, Cordoyiannis G, Raptis I, Valamontes ES Journal of Adhesion Science and Technology, 17(8), 1083, 2003 |
| 8 |
Etching behavior of Si-containing polymers as resist materials for bilayer lithography: The case of poly-dimethyl siloxane Tserepi A, Cordoyiannis G, Patsis GP, Constantoudis V, Gogolides E, Valamontes ES, Eon D, Peignon MC, Cartry G, Cardinaud C, Turban G Journal of Vacuum Science & Technology B, 21(1), 174, 2003 |
| 9 |
Quantification of line-edge roughness of photoresists. I. A comparison between off-line and on-line analysis of top-down scanning electron microscopy images Patsis GP, Constantoudis V, Tserepi A, Gogolides E, Grozev G Journal of Vacuum Science & Technology B, 21(3), 1008, 2003 |
| 10 |
Quantification of line-edge roughness of photoresists. II. Scaling and fractal analysis and the best roughness descriptors Constantoudis V, Patsis GP, Tserepi A, Gogolides E Journal of Vacuum Science & Technology B, 21(3), 1019, 2003 |