검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Thermal modeling of a polysilicon-metal test structure used for thermally induced voltage alteration characterization Tangyunyong P, Benson D, Cole EI Journal of Vacuum Science & Technology B, 18(6), 2820, 2000 |
| No. | Article |
|---|---|
| 1 |
Thermal modeling of a polysilicon-metal test structure used for thermally induced voltage alteration characterization Tangyunyong P, Benson D, Cole EI Journal of Vacuum Science & Technology B, 18(6), 2820, 2000 |