검색결과 : 1건
No. | Article |
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1 |
Carbon contamination of EUV mask and its effect on CD performance Lee S, Doh JG, Lee JU, Lee I, Jeong CY, Lee DG, Rah SY, Ahn J Current Applied Physics, 11(4), S107, 2011 |
No. | Article |
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1 |
Carbon contamination of EUV mask and its effect on CD performance Lee S, Doh JG, Lee JU, Lee I, Jeong CY, Lee DG, Rah SY, Ahn J Current Applied Physics, 11(4), S107, 2011 |