검색결과 : 8건
No. | Article |
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1 |
Formation of graphene-capped cobalt silicides Grebenyuk GS, Dunaevsky SM, Lobanova EY, Smirnov DA, Pronin II Applied Surface Science, 470, 840, 2019 |
2 |
Scanning tunneling microscopy study of the early stages of epitaxial growth of CoSi2 and CoSi films on Si(111) substrate: Surface and interface analysis Kotlyar VG, Alekseev AA, Olyanicha DA, Utas TV, Zotov AV, Saranin AA Thin Solid Films, 619, 153, 2016 |
3 |
Positron beam studies of cobalt silicides Abhaya S, Amarendra G Applied Surface Science, 255(1), 237, 2008 |
4 |
Raman spectroscopic studies of the formation processes of cobalt silicide thin films Liu FM, Ye JH, Ren B, Yang ZL, Liao YY, See A, Chan L, Tian ZQ Thin Solid Films, 471(1-2), 257, 2005 |
5 |
Stress evolution in Co/Ti/Si system Guo SS, Chu YC, Tsai CJ Materials Chemistry and Physics, 88(1), 71, 2004 |
6 |
CoSi2 formation through SiO2 Detavernier C, Van Meirhaeghe RL, Cardon F, Maex K Thin Solid Films, 386(1), 19, 2001 |
7 |
Growth of epitaxial CoSi2 for contacts of ultra-thin SOI MOSFETs Sakamoto K, Maeda T, Hasegawa M Thin Solid Films, 369(1-2), 240, 2000 |
8 |
Spectroscopic ellipsometry studies of buried CoSi2 layers in Si formed by ion implantation with a metal vapor vacuum arc ion source Guo WS Thin Solid Films, 375(1-2), 280, 2000 |