검색결과 : 104건
| No. | Article |
|---|---|
| 1 |
Study of line-TFET analog performance comparing with other TFET and MOSFET architectures Agopian PGD, Martino JA, Vandooren A, Rooyackers R, Simoen E, Thean A, Claeys C Solid-State Electronics, 128, 43, 2017 |
| 2 |
Understanding and optimizing the floating body retention in FDSOI UTBOX Aoulaiche M, Simoen E, Caillat C, Witters L, Bourdelle KK, Nguyen BY, Martino J, Claeys C, Fazan P, Jurczak M Solid-State Electronics, 117, 123, 2016 |
| 3 |
Comparative analysis of the intrinsic voltage gain and unit gain frequency between SOI and bulk FinFETs up to high temperatures de Oliveira AV, Agopian PGD, Martino JA, Simoen E, Claeys C, Collaert N, Thean A Solid-State Electronics, 123, 124, 2016 |
| 4 |
Random telegraph noise: The key to single defect studies in nano-devices Simoen E, Fang W, Aoulaiche M, Luo J, Zhao C, Claeys C Thin Solid Films, 613, 2, 2016 |
| 5 |
Different stress techniques and their efficiency on triple-gate SOI n-MOSFETs Buuhler RT, Agopian PGD, Collaert N, Simoen E, Claeys C, Martino JA Solid-State Electronics, 103, 209, 2015 |
| 6 |
Impact of processing and back-gate biasing conditions on the low-frequency noise of ultra-thin buried oxide silicon-on-insulator nMOSFETs Kudina V, Garbar N, Simoen E, Claeys C Solid-State Electronics, 105, 37, 2015 |
| 7 |
Identification of Si film traps in p-channel SOI FinFETs using low temperature noise spectroscopy Achour H, Cretu B, Simoen E, Routoure JM, Carin R, Benfdila A, Aoulaiche M, Claeys C Solid-State Electronics, 112, 1, 2015 |
| 8 |
Enhanced dynamic threshold voltage UTBB SOI nMOSFETs Sasaki KRA, Manini MB, Simoen E, Claeys C, Martino JA Solid-State Electronics, 112, 19, 2015 |
| 9 |
Analog performance of vertical nanowire TFETs as a function of temperature and transport mechanism Martino MD, Neves F, Agopian PGD, Martino JA, Vandooren A, Rooyackers R, Simoen E, Thean A, Claeys C Solid-State Electronics, 112, 51, 2015 |
| 10 |
Advantages of different source/drain engineering on scaled UTBOX FDSOI nMOSFETs at high temperature operation Nicoletti T, dos Santos SD, Martino JA, Aoulaiche M, Veloso A, Jurczak M, Simoen E, Claeys C Solid-State Electronics, 91, 53, 2014 |