검색결과 : 2건
No. | Article |
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1 |
X-ray multiple diffraction in the characterization of TiNO and TiO2 thin films grown on Si(001) Chiaramonte T, Abramof E, Fabreguette F, Sacilotti M, Cardoso LP Applied Surface Science, 253(3), 1590, 2006 |
2 |
Structural characterization of TiO2/TiNxOy (delta-doping) heterostructures on (110)TiO2 substrates Chiaramonte T, Cardoso LP, Gelamo RV, Fabreguette F, Sacilotti M, de Lucas MCM, Imhoff L, Bourgeois S, Kihn Y, Casanove MJ Applied Surface Science, 212, 661, 2003 |