화학공학소재연구정보센터
검색결과 : 2건
No. Article
1 X-ray multiple diffraction in the characterization of TiNO and TiO2 thin films grown on Si(001)
Chiaramonte T, Abramof E, Fabreguette F, Sacilotti M, Cardoso LP
Applied Surface Science, 253(3), 1590, 2006
2 Structural characterization of TiO2/TiNxOy (delta-doping) heterostructures on (110)TiO2 substrates
Chiaramonte T, Cardoso LP, Gelamo RV, Fabreguette F, Sacilotti M, de Lucas MCM, Imhoff L, Bourgeois S, Kihn Y, Casanove MJ
Applied Surface Science, 212, 661, 2003