1 |
Fabrication and characterisation of ultra-thin tungsten-carbon (W/C) and platinum-carbon (Pt/C) multilayers for X-ray mirrors Gan BK, Latella BA, Cheary RW Applied Surface Science, 239(2), 237, 2005 |
2 |
X-ray reflectivity study of radio frequency sputtered silicon oxide on silicon Solina DM, Cheary RW, Kalceff W, McCredie G Thin Solid Films, 489(1-2), 37, 2005 |
3 |
The fabrication of stable platinum-silicon oxide multilayers for X-ray mirrors Solina DM, Cheary RW, Swift PD, McCredie G Thin Solid Films, 423(1), 1, 2003 |
4 |
Investigation of the interfacial structure of ultra-thin platinum film deposited by cathodic-arc Swift PD, Solina DM, Cheary RW, McCredie GM Thin Solid Films, 440(1-2), 117, 2003 |
5 |
In situ studies of X-ray diffraction line profiles from strained copper foils Cheary RW, Tang CC, Lynch P, Roberts MA, Clark SM Materials Science Forum, 378-3, 254, 2001 |
6 |
Instrumental resolution function of the ESRF powder diffraction beamline BM16 Masson O, Dooryhee E, Cheary RW, Fitch AN Materials Science Forum, 378-3, 300, 2001 |
7 |
X-ray diffraction line broadening from gold and platinum thin films Lynch PA, Cheary RW, Dooryhee E, Armstrong N, Tang C Materials Science Forum, 378-3, 358, 2001 |
8 |
Quantitative phase analysis by X-ray diffraction of martensite and austenite in strongly oriented orthodontic stainless steel wires Cheary RW, Ying MS Journal of Materials Science, 35(5), 1105, 2000 |
9 |
Investigation of the interfacial structure of ultra-thin platinum films using X-ray reflectivity and X-ray photoelectron spectroscopy Solina DM, Cheary RW, Swift PD, Dligatch S, McCredie GM, Gong B, Lynch P Thin Solid Films, 372(1-2), 94, 2000 |
10 |
An analysis of Ag/Al2O3 angular selective films by x-ray reflectivity Dligatch S, Cheary RW, Smith GB Thin Solid Films, 312(1-2), 4, 1998 |