화학공학소재연구정보센터
검색결과 : 3건
No. Article
1 Study of charge loss mechanisms for nano-sized localized trapping SONOS memory devices
Xu Y, Yue H, Zhao FF
Solid-State Electronics, 91, 118, 2014
2 Investigation of impact of shallow trench isolation on SONOS type memory cells
Xu Y, Yan F, Chen DJ, Shi Y, Li ZG, Yang F, Wang J, Wang YG, Lin P, Chang JG, Yi C
Solid-State Electronics, 54(12), 1644, 2010
3 Characterization of the spatial charge distribution in local charge-trapping memory devices using the charge-pumping technique
Rosmeulen M, Breuil L, Lorenzini M, Haspeslag L, Van Houdt J, De Meyer K
Solid-State Electronics, 48(9), 1525, 2004