1 |
Circular electrodes to reduce the current variation of OTFTs with the drop-casted semiconducting layer Kabir HMD, Ahmed Z, Kariyadan R, Zhang LN, Chan MS Solid-State Electronics, 144, 49, 2018 |
2 |
Carrier Type Control of WSe2 Field-Effect Transistors by Thickness Modulation and MoO3 Layer Doping Zhou CJ, Zhao YD, Raju S, Wang Y, Lin ZY, Chan MS, Chai Y Advanced Functional Materials, 26(23), 4223, 2016 |
3 |
Extraction and modeling of layout-dependent MOSFET gate-to-source/drain fringing capacitance in 40 nm technology Sun LJ, Shang GB, Liu LL, Cheng J, Guo A, Ren Z, Hu SJ, Chen SM, Zhao YH, Chan MS, Zhang L, Li XJ, Shi YL Solid-State Electronics, 111, 118, 2015 |
4 |
Highly Aligned Graphene/Polymer Nanocomposites with Excellent Dielectric Properties for High-Performance Electromagnetic Interference Shielding Yousefi N, Sun XY, Lin XY, Shen X, Jia JJ, Zhang B, Tang BZ, Chan MS, Kim JK Advanced Materials, 26(31), 5480, 2014 |
5 |
Surface acoustic wave resonators based on (002) AlN/Pt/diamond/silicon layered structure Zhou CJ, Yang Y, Jin H, Feng B, Dong SR, Luo JK, Ren TL, Chan MS, Yang CY Thin Solid Films, 548, 425, 2013 |
6 |
A generic numerical model for detection of terahertz radiation in MOS field-effect transistors Wang YL, Yan ZF, Zhu JX, Zhang LN, Lin XN, He J, Cao JC, Chan MS Solid-State Electronics, 54(8), 791, 2010 |
7 |
Analytical solution of subthreshold channel potential of gate underlap cylindrical gate-all-around MOSFET Zhang LN, Ma CY, He J, Lin XN, Chan MS Solid-State Electronics, 54(8), 806, 2010 |
8 |
A charge-based compact model for predicting the current-voltage and capacitance-voltage characteristics of heavily doped cylindrical surrounding-gate MOSFETs Liu FL, Zhang J, He F, Liu F, Zhang LN, Chan MS Solid-State Electronics, 53(1), 49, 2009 |
9 |
An explicit surface-potential-based model for undoped double-gate MOSFETs Gong JF, Chan PCH, Chan MS Solid-State Electronics, 52(2), 282, 2008 |
10 |
An explicit current-voltage model for undoped double-gate MOSFETs based on accurate yet analytic approximation to the carrier concentration (vol 51, pg 179, 2007) He J, Bian W, Tao YD, Liu F, Lu KL, Wu W, Wang T, Chan MS Solid-State Electronics, 51(5), 816, 2007 |