화학공학소재연구정보센터
검색결과 : 28건
No. Article
1 alpha-Ga2O3 grown by low temperature atomic layer deposition on sapphire
Roberts JW, Jarman JC, Johnstone DN, Midgley PA, Chalker PR, Oliver RA, Massabuau FCP
Journal of Crystal Growth, 487, 23, 2018
2 The influence of tertiary butyl hydrazine as a co-reactant on the atomic layer deposition of silver
Golrokhi Z, Marshall PA, Romani S, Rushworth S, Chalker PR, Potter RJ
Applied Surface Science, 399, 123, 2017
3 Tailoring Precursors for Deposition: Synthesis, Structure, and Thermal Studies of Cyclopentadienylcopper(I) Isocyanide Complexes
Willcocks AM, Pugh T, Cosham SD, Hamilton J, Sung SL, Heil T, Chalker PR, Williams PA, Kociok-Kohn G, Johnson AL
Inorganic Chemistry, 54(10), 4869, 2015
4 Ce(IV) Complexes with Donor-Functionalized Alkoxide Ligands: Improved Precursors for Chemical Vapor Deposition of CeO2
Aspinall HC, Bacsa J, Jones AC, Wrench JS, Black K, Chalker PR, King PJ, Marshall P, Werner M, Davies HO, Odedra R
Inorganic Chemistry, 50(22), 11644, 2011
5 Dimethylzinc adduct chemistry revisited: MOCVD of vertically aligned ZnO nanowires using the dimethylzinc 1,4-dioxane adduct
Kanjolia R, Jones AC, Ashraf S, Bacsa J, Black K, Chalker PR, Beahan P, Hindley S, Odedra R, Williams PA, Heys PN
Journal of Crystal Growth, 315(1), 292, 2011
6 Direct observation by transmission electron microscopy of the influence of Ni catalyst-seeds on the growth of GaN-AlGaN axial heterostructure nanowires
Lari L, Walther T, Gass MH, Geelhaar L, Cheze C, Riechert H, Bullough TJ, Chalker PR
Journal of Crystal Growth, 327(1), 27, 2011
7 Effect of deposition temperature on the properties of CeO2 films grown by atomic layer deposition
King PJ, Werner M, Chalker PR, Jones AC, Aspinall HC, Basca J, Wrench JS, Black K, Davies HO, Heys PN
Thin Solid Films, 519(13), 4192, 2011
8 MOCVD of ZnO thin films for potential use as compliant layers for GaN on Si (vol 310, pg 1010, 2008)
Black K, Jones AC, Chalker PR, Gaskell JM, MurreyB RT, Joyce TB, Rushworth SA
Journal of Crystal Growth, 311(23-24), 4812, 2009
9 Gd silicate: A high-k dielectric compatible with high temperature annealing
Gottlob HDB, Stefani A, Schmidt M, Lemme MC, Kurz H, Mitrovic IZ, Werner M, Davey WM, Hall S, Chalker PR, Cherkaoui K, Hurley PK, Piscator J, Engstrom O, Newcomb SB
Journal of Vacuum Science & Technology B, 27(1), 249, 2009
10 Frequency dispersion and dielectric relaxation of La2Hf2O7
Zhao CZ, Taylor S, Werner M, Chalker PR, Gaskell JM, Jones AC
Journal of Vacuum Science & Technology B, 27(1), 333, 2009