| 1 |
Rupture force of adsorbed self-assembled surfactant layers - Effect of the dielectric exchange force
Teschke O, Ceotto G, de Souza EF
Chemical Physics Letters, 344(5-6), 429, 2001 |
| 2 |
Ionic surfactant films imaged by atomic force microscopy
Ceotto G, de Souza EF, Teschke O
Journal of Molecular Catalysis A-Chemical, 167(1-2), 225, 2001 |
| 3 |
Dielectric constant measurements of interfacial aqueous solutions using atomic force microscopy
de Souza EF, Ceotto G, Teschke O
Journal of Molecular Catalysis A-Chemical, 167(1-2), 235, 2001 |
| 4 |
Interfacial aqueous solutions dielectric constant measurements using atomic force microscopy
Teschke O, Ceotto G, de Souza EF
Chemical Physics Letters, 326(3-4), 328, 2000 |
| 5 |
Imaging of soft structures: Dependence of contrast in atomic force microscopy images on the force applied by the tip
Teschke O, Ceotto G, de Souza EF
Journal of Vacuum Science & Technology B, 18(3), 1144, 2000 |
| 6 |
Double layer relaxation measurements using atomic force microscopy
Teschke O, de Souza EF, Ceotto G
Langmuir, 15(15), 4935, 1999 |
