검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Characterization of thin-film amorphous semiconductors using spectroscopic ellipsometry Jellison GE, Merkulov VI, Puretzky AA, Geohegan DB, Eres G, Lowndes DH, Caughman JB Thin Solid Films, 377-378, 68, 2000 |
| No. | Article |
|---|---|
| 1 |
Characterization of thin-film amorphous semiconductors using spectroscopic ellipsometry Jellison GE, Merkulov VI, Puretzky AA, Geohegan DB, Eres G, Lowndes DH, Caughman JB Thin Solid Films, 377-378, 68, 2000 |