검색결과 : 6건
| No. | Article |
|---|---|
| 1 |
A review of the mechanical stressors efficiency applied to the ultra-thin body & buried oxide fully depleted silicon on insulator technology Morin P, Maitrejean S, Allibert F, Augendre E, Liu Q, Loubet N, Grenouillet L, Pofelski A, Chen KG, Khakifirooz A, Wacquez R, Reboh S, Bonnevialle A, le Royer C, Morand Y, Kanyandekwe J, Chanemougamme D, Mignot Y, Escarabajal Y, Lherron B, Chafik F, Pilorget S, Caubet P, Vinet M, Clement L, Desalvo B, Doris B, Kleemeier W Solid-State Electronics, 117, 100, 2016 |
| 2 |
Interface and plasma damage analysis of PEALD TaCN deposited on HfO2 for advanced CMOS studied by angle resolved XPS and C-V Piallat F, Beugin V, Gassilloud R, Dussault L, Pelissier B, Leroux C, Caubet P, Vallee C Applied Surface Science, 303, 388, 2014 |
| 3 |
Investigating doping effects on high-kappa metal gate stack for effective work function engineering Leroux C, Baudot S, Charbonnier M, Van Der Geest A, Caubet P, Toffoli A, Blaise P, Ghibaudo G, Martin F, Reimbold G Solid-State Electronics, 88, 21, 2013 |
| 4 |
Revealing Atom-Radical Reactivity at Low Temperature Through the N plus OH Reaction Daranlot J, Jorfi M, Xie CJ, Bergeat A, Costes M, Caubet P, Xie DQ, Guo H, Honvault P, Hickson KM Science, 334(6062), 1538, 2011 |
| 5 |
Low-temperature low-resistivity PEALD TiN using TDMAT under hydrogen reducing ambient Caubet P, Blomberg T, Benaboud R, Wyon C, Blanquet E, Gonchond JP, Juhel M, Bouvet P, Gros-Jean M, Michailos J, Richard C, Iteprat B Journal of the Electrochemical Society, 155(8), H625, 2008 |
| 6 |
CN(A(2)Pi(i) -> X-2 Sigma(+)) chemiluminescence from the N+C2N, N+CCl, and N+C-2 reactions under low-pressure fast-flow conditions Daugey N, Bergeat A, Loison JC, Schuck A, Caubet P, Dorthe G Chemical Physics Letters, 324(1-3), 1, 2000 |