화학공학소재연구정보센터
검색결과 : 4건
No. Article
1 Drain-current variability in 45 nm bulk N-MOSFET with and without pocket-implants
Mezzomo CM, Bajolet A, Cathignol A, Ghibaudo G
Solid-State Electronics, 65-66, 163, 2011
2 Modeling local electrical fluctuations in 45 nm heavily pocket-implanted bulk MOSFET
Mezzomo CM, Bajolet A, Cathignol A, Josse E, Ghibaudo G
Solid-State Electronics, 54(11), 1359, 2010
3 Abnormally high local electrical fluctuations in heavily pocket-implanted bulk long MOSFET
Cathignol A, Bordez S, Cros A, Rochereau K, Ghibaudo G
Solid-State Electronics, 53(2), 127, 2009
4 High threshold voltage matching performance on gate-all-around MOSFET
Cathignol A, Cros A, Harrison S, Cerrutti R, Coronel P, Pouydebasque A, Rochereau K, Skotnicki T, Ghibaudo G
Solid-State Electronics, 51(11-12), 1450, 2007