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| No. | Article |
|---|---|
| 1 |
Capacitance study of carrier inversion at the amorphous/crystalline silicon heterojunction passivated by different thicknesses of i-layer Mikolasek M, Stuchlikova L, Harmatha L, Vincze A, Nemec M, Racko J, Breza J Applied Surface Science, 312, 152, 2014 |