검색결과 : 7건
| No. | Article |
|---|---|
| 1 |
Structural variations in polysilicon, associated with deposition temperature and degree of anneal Parr AA, Gardiner DJ, Carline RT, King DO, Williams GM Journal of Materials Science, 36(1), 207, 2001 |
| 2 |
In situ optical monitoring for SiGe epitaxy Robbins DJ, Pickering C, Russell J, Carline RT, Dann AW, Marrs AD, Glasper JL Journal of Crystal Growth, 209(2-3), 290, 2000 |
| 3 |
Characterization of oxide layers on GaAs substrates Allwood DA, Carline RT, Mason NJ, Pickering C, Tanner BK, Walker PJ Thin Solid Films, 364(1-2), 33, 2000 |
| 4 |
Optical properties of bonded silicon silicide on insulator ((SOI)-O-2) : a new substrate for electronic and optical devices Nayar V, Russell J, Carline RT, Pidduck AJ, Quinn C, Nevin A, Blackstone S Thin Solid Films, 313-314, 276, 1998 |
| 5 |
Real-time photo-spectroscopic ellipsometry measurement of electric field and composition in semiconductors Carline RT, Russell J, Hosea TJC, Thomas PJS, Pickering C Thin Solid Films, 313-314, 579, 1998 |
| 6 |
Real-Time Control of Layer Thickness in LPCVD Si/Si.Ge-88.(12) HBT Structures Hope DA, Pickering C, Carline RT, Leong WY, Robbins DJ Thin Solid Films, 294(1-2), 18, 1997 |
| 7 |
Real-Time Spectroscopic Ellipsometry Monitoring of Si1-xGex/Si Epitaxial-Growth Pickering C, Hope DA, Carline RT, Robbins DJ Journal of Vacuum Science & Technology A, 13(3), 740, 1995 |