검색결과 : 12건
No. | Article |
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1 |
Thermally stable epitaxial ZrN/carrier-compensated Sc0.99Mg0.01N metal/semiconductor multilayers for thermionic energy conversion Garbrecht M, McCarroll I, Yang LM, Bhatia V, Biswas B, Rao D, Cairney JM, Saha B Journal of Materials Science, 55(4), 1592, 2020 |
2 |
Novel complex ceramic oxides, Ln(2)TiO(5)(Ln = La, Sm, Gd, Tb, Dy, Ho, Er, and Yb), for polyphase nuclear waste-forms Aughterson RD, Lumpkin GR, Smith KL, Cairney JM Journal of the American Ceramic Society, 103(10), 5536, 2020 |
3 |
Observation of hydrogen trapping at dislocations, grain boundaries, and precipitates Chen YS, Lu HZ, Liang JT, Rosenthal A, Liu HW, Sneddon G, McCarroll I, Zhao ZZ, Li W, Guo AM, Cairney JM Science, 367(6474), 171, 2020 |
4 |
A New Approach to Understand the Adsorption of Thiophene on Different Surfaces: An Atom Probe Investigation of Self-Assembled Monolayers Eder K, Felfer PJ, Gault B, Ceguerra AV, La Fontaine A, Masters AF, Maschmeyer T, Cairney JM Langmuir, 33(38), 9573, 2017 |
5 |
Phase Evolution upon Aging of Air Plasma Sprayed t'-Zirconia Coatings: II-Microstructure Evolution Krogstad JA, Leckie RM, Kramer S, Cairney JM, Lipkin DM, Johnson CA, Levi CG Journal of the American Ceramic Society, 96(1), 299, 2013 |
6 |
Phase Stability of t'-Zirconia-Based Thermal Barrier Coatings: Mechanistic Insights Krogstad JA, Kramer S, Lipkin DM, Johnson CA, Mitchell DRG, Cairney JM, Levi CG Journal of the American Ceramic Society, 94, S168, 2011 |
7 |
Some factors affecting EBSD pattern quality of Ga+ ion-milled face centred cubic metal surfaces Mateescu N, Ferry M, Xu W, Cairney JM Materials Chemistry and Physics, 106(1), 142, 2007 |
8 |
Three dimensional imaging of deformation modes in TiN-based thin film coatings Ma LW, Cairney JM, McGrouther D, Hoffman M, Munroe PR Thin Solid Films, 515(6), 3190, 2007 |
9 |
Deformation and fracture of Ti-Si-N nanocomposite films Cairney JM, Hoffman MJ, Munroe PR, Martin PJ, Bendavid A Thin Solid Films, 479(1-2), 193, 2005 |
10 |
Characterization of TiN thin films subjected to nanoindentation using focused ion beam milling Ma LW, Cairney JM, Hoffman MJ, Munroe PR Applied Surface Science, 237(1-4), 631, 2004 |