화학공학소재연구정보센터
검색결과 : 12건
No. Article
1 Thermally stable epitaxial ZrN/carrier-compensated Sc0.99Mg0.01N metal/semiconductor multilayers for thermionic energy conversion
Garbrecht M, McCarroll I, Yang LM, Bhatia V, Biswas B, Rao D, Cairney JM, Saha B
Journal of Materials Science, 55(4), 1592, 2020
2 Novel complex ceramic oxides, Ln(2)TiO(5)(Ln = La, Sm, Gd, Tb, Dy, Ho, Er, and Yb), for polyphase nuclear waste-forms
Aughterson RD, Lumpkin GR, Smith KL, Cairney JM
Journal of the American Ceramic Society, 103(10), 5536, 2020
3 Observation of hydrogen trapping at dislocations, grain boundaries, and precipitates
Chen YS, Lu HZ, Liang JT, Rosenthal A, Liu HW, Sneddon G, McCarroll I, Zhao ZZ, Li W, Guo AM, Cairney JM
Science, 367(6474), 171, 2020
4 A New Approach to Understand the Adsorption of Thiophene on Different Surfaces: An Atom Probe Investigation of Self-Assembled Monolayers
Eder K, Felfer PJ, Gault B, Ceguerra AV, La Fontaine A, Masters AF, Maschmeyer T, Cairney JM
Langmuir, 33(38), 9573, 2017
5 Phase Evolution upon Aging of Air Plasma Sprayed t'-Zirconia Coatings: II-Microstructure Evolution
Krogstad JA, Leckie RM, Kramer S, Cairney JM, Lipkin DM, Johnson CA, Levi CG
Journal of the American Ceramic Society, 96(1), 299, 2013
6 Phase Stability of t'-Zirconia-Based Thermal Barrier Coatings: Mechanistic Insights
Krogstad JA, Kramer S, Lipkin DM, Johnson CA, Mitchell DRG, Cairney JM, Levi CG
Journal of the American Ceramic Society, 94, S168, 2011
7 Some factors affecting EBSD pattern quality of Ga+ ion-milled face centred cubic metal surfaces
Mateescu N, Ferry M, Xu W, Cairney JM
Materials Chemistry and Physics, 106(1), 142, 2007
8 Three dimensional imaging of deformation modes in TiN-based thin film coatings
Ma LW, Cairney JM, McGrouther D, Hoffman M, Munroe PR
Thin Solid Films, 515(6), 3190, 2007
9 Deformation and fracture of Ti-Si-N nanocomposite films
Cairney JM, Hoffman MJ, Munroe PR, Martin PJ, Bendavid A
Thin Solid Films, 479(1-2), 193, 2005
10 Characterization of TiN thin films subjected to nanoindentation using focused ion beam milling
Ma LW, Cairney JM, Hoffman MJ, Munroe PR
Applied Surface Science, 237(1-4), 631, 2004