검색결과 : 10건
No. | Article |
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1 |
A Decentralized Controller-Observer Scheme for Multi-Agent Weighted Centroid Tracking Antonelli G, Arrichiello F, Caccavale F, Marino A IEEE Transactions on Automatic Control, 58(5), 1310, 2013 |
2 |
An integrated approach to fault diagnosis for a class of chemical batch processes Caccavale F, Pierri F, Iamarino M, Tufano V Journal of Process Control, 19(5), 827, 2009 |
3 |
SiO2 films deposited on silicon at low temperature by plasma-enhanced decomposition of hexamethyldisilazane: Defect characterization Croci S, Pecheur A, Autran JL, Vedda A, Caccavale F, Martini M, Spinolo G Journal of Vacuum Science & Technology A, 19(5), 2670, 2001 |
4 |
Task-space regulation of cooperative manipulators Caccavale F, Chiacchio P, Chiaverini S Automatica, 36(6), 879, 2000 |
5 |
Domain walls characterization of the opposite domain lithium niobate structures Bermudez V, Caccavale F, Dieguez E Journal of Crystal Growth, 219(4), 413, 2000 |
6 |
Stability analysis of a joint space control law for a two-manipulator system Caccavale F, Chiacchio P, Chiaverini S IEEE Transactions on Automatic Control, 44(1), 85, 1999 |
7 |
Robot impedance control with nondiagonal stiffness Caccavale F, Siciliano B, Villani L IEEE Transactions on Automatic Control, 44(10), 1943, 1999 |
8 |
Characterisation of antireflective TiO2//SiO2 coatings by complementary techniques Battaglin C, Caccavale F, Menelle A, Montecchi M, Nichelatti E, Nicoletti F, Polato P Thin Solid Films, 351(1-2), 176, 1999 |
9 |
Chemical-Vapor-Deposition and Characterization of Gallium Oxide Thin-Films Battiston GA, Gerbasi R, Porchia M, Bertoncello R, Caccavale F Thin Solid Films, 279(1-2), 115, 1996 |
10 |
XRD, XPS and SIMS Investigations on Electrodeposited Nickel-Phosphorus Alloy Coatings Haseeb AS, Chakraborty P, Ahmed I, Caccavale F, Bertoncello R Thin Solid Films, 283(1-2), 140, 1996 |