검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Dual Unit Scanning Tunneling Microscope Atomic-Force Microscope for Length Measurement Based on Reference Scales Zhang HJ, Huang F, Higuchi T Journal of Vacuum Science & Technology B, 15(4), 780, 1997 |
| No. | Article |
|---|---|
| 1 |
Dual Unit Scanning Tunneling Microscope Atomic-Force Microscope for Length Measurement Based on Reference Scales Zhang HJ, Huang F, Higuchi T Journal of Vacuum Science & Technology B, 15(4), 780, 1997 |