| 1 |
An analytical channel thermal noise model for deep-submicron MOSFETs with short channel effects
Jeon J, Lee JD, Park BG, Shin H
Solid-State Electronics, 51(7), 1034, 2007 |
| 2 |
Characterization of high quality nitrided gate dielectric films manufactured in reduced pressure furnace for ultralarge scale integration complementary metal oxide semiconductor applications
Yoon G, Epstein Y
Journal of the Electrochemical Society, 145(5), 1679, 1998 |
| 3 |
Experimental methods for investigating the defect properties of SiO2 in metal oxide semiconductor transistors
Weber W, Thewes R
Journal of the Electrochemical Society, 145(10), 3638, 1998 |
| 4 |
Polycrystalline Silicon Thin-Film Transistors - A Continuous Evolving Technology
Fortunato G
Thin Solid Films, 296(1-2), 82, 1997 |
| 5 |
Role of Surface-Chemistry in Semiconductor Thin-Film Processing
Ekerdt JG, Sun YM, Szabo A, Szulczewski GJ, White JM
Chemical Reviews, 96(4), 1499, 1996 |
| 6 |
The Perspectives of Silicon-on-Insulator Technologies for Cryogenic Applications
Claeys C, Simoen E
Journal of the Electrochemical Society, 141(9), 2522, 1994 |
