검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
A time-dependent technique for carrier recombination and generation lifetime measurement in SOI MOSFET Zhang G, Yoo WJ, Ling CH Solid-State Electronics, 52(11), 1773, 2008 |
| 2 |
Heterostructure Interface Characterization Using Scanning Tunneling Microscope Excited Time-Resolved Luminescence Horn J, Vogt A, Aller I, Hartnagel HL, Stehle M Journal of Vacuum Science & Technology B, 14(2), 820, 1996 |